Vibrational spectroscopy, Raman and Fourier Transform Infrared (FTIR) spectroscopies are analytical techniques that are of great utility for unknown substance identification. This is achieved by comparing measured spectra to the extensive reference database. These techniques are applied in the pharmaceutical, semiconductor and microelectronics industries for quality assurance, failure analysis and for service life. Raman spectroscopy is used extensively in advanced materials research and development analysis, such as nano-carbon analysis. Where trace sample measurements are required, it can be advantageous to employ either Surface Enhanced Raman Spectroscopy (SERS) or Surface Enhanced IR Absorption Spectroscopy, both of which can provide much higher detection sensitivity.
- Calibration of reflectance and transmittance standards
- Provision of certification data for wavenumber standards
- Surface-enhanced Raman Spectroscopy (SERS) applicable to trace sample analysis
- Vibrational spectra measurement and spectral interpretation (e.g. functional group identification, spectral identification through spectral matching analysis)
- Microscopy and microspectroscopy through chemical imaging/mapping
- Strain and stress analysis for planar solid state materials (e.g. semiconductor wafer)
- Attenuated total reflectance FTIR chemical imaging of nanometer thickness films
- Liquid and gas sample measurement and analysis (Raman and FTIR)
- Chemical and optical properties of inorganic and organic materials
- Interpretation of material properties
- Development of custom components (e.g. THz beam splitter)
- Quantitative analysis possible under certain measurement conditions
- Handheld portable Raman systems used for on-site measurements
- Investigating potential failure mode
The NRC's Raman Metrology facility is equipped with high spectral and spatial resolution commercial micro-Raman spectrometers. These spectrometers have multiple excitation wavelengths covering the UV-NIR spectral range. The microRaman systems are configured in retroreflective geometry with Olympus BX41/51 microscope coupled to Czerny-turner monochromomators. These systems are also equipped with macro-sampling and liquid sampling accessories. The systems have motorized XYZ stages with a minimum step size of 0.05 microns. A software controlled high speed mapping function allows rapid construction of 2D and 3D hyperspectral datasets. Automated stages in the Z‑dimension enables depth profiling. Commercial chemometric analysis software packages allow for multivariate analysis of the hyperspectral data cube and for data reduction. The Raman mapping resolution is dependent on many factors, but is typically 1 μm.
For infrared analysis, the NRC's facilities include several FTIR spectrometers with various sampling accessories, including those for transmittance, reflectance, diffuse reflectance, photoluminescence, attenuated total reflectance (ATR), grazing angle reflectance, polarization effects and microscopy. The FTIR capability covers the range from visible wavelengths ( λ ~ 500 nm/ 20,000 cm -1) to terahertz wavelengths ( λ > 1 mm / 10 cm -1). Throughout this range, the NRC develops custom components as needed. In certain wavelength ranges, quantum cascade lasers can be deployed for use in conjunction with microscopy for IR spectrophotometry requiring high brightness sources. IR microscopes are available to obtain chemical maps and images of material surfaces with relatively high spatial resolution. A complete 128×128 chemical image is obtained in 1 second with a microscope equipped with an IR focal plane array camera for which the highest spatial resolution is obtained in ATR with a pixel size of approximately 1 µm.
Fees for service
If you wish to order a measurement service, please request a quote.
Note that fees for measurement and calibration services are subject to change. The fees for service quoted do not include shipping, insurance or the cost of a customs broker. The client must arrange and pay for these services separately.
|A33-06-10-00||Custom Raman / FTIR measurements or services||Fee on request|